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Mechelle 5000

Andor’s new Mechelle ME5000 Echelle spectrograph has been designed to provide simultaneous recording of a wide wavelength range (200-975 nm) in one acquisition. It has no moving components is available in a pre-aligned detector/spectrometer format.

  • Compact and robust design
  • Patented optical design
  • Auto-temperature correction
  • N2 purged
  • Pre-aligned detector/spectrograph


お問い合わせ

Andor’s new Mechelle ME5000 Echelle spectrograph has been designed to provide simultaneous recording of a wide wavelength range (200-975 nm) in one acquisition. It has no moving components is available in a pre-aligned detector/spectrometer format. The Andor Mechelle spectrograph is based on the echelle grating principal and its patented optical design provides extremely low cross-talk and maximum resolution compared with other spectrographs.

Compact and robust design with no moving components - Ideal for non-lab based applications

Patented optical design - Ensures maximum resolution and extremely low cross-talk

Auto-temperature correction - Corrects for the variation of prisms optical refractive index with temperature

N2 purged - Enables maximum throughput in the UV region

Pre-aligned detector/spectrograph solution - Enables fast, efficient experimental set-up

Low F/number - Highly efficent light collection

Wide range of accessories available - Including fibre optics, slits, aiming Laser, collector/collimator and calibration lamps

Andor Solis software - Extracts automatically a full wavelength calibrated spectrum from a complex echelle image and offers system advanced data manipulation capabilities

Peak labelling with NIST table - Easy tagging of known atomic species at the press of a button

アップグレード・アクセサリー

ACC-LK-HGAR-OCE - Mercury-Argon calibration lamp with SMA connector  

LK-DHRD-OCE-CAL - Deuterium-Halogen lamp, radiometrically calibrated (230 to 1,050 nm)

ME-OPT-0007 - UV-NIR light collector / collimator with laser module for F/# = 2 collection

ME-SHT-9002 - Mechelle shutter unit (recommended when using iKon-M DU934P-yy-9FL)

ME-SLT-25x25 - Mechelle 25 x 25 µm slit

ME-SLT-10x50 - Mechelle 10 x 50 µm slit

ME-SLT-50x25 - Mechelle 50 x 25 µm slit

ME-SLT-25x50 - Mechelle 25 x 50 µm slit

ME-SLT-50x50 - Mechelle 50 x 50 µm slit

ME-SLT-100x50 - Mechelle 100 x 50 µm slit

ME-SLT-200x50 - Mechelle 200 x 50 µm slit

その他アプリケーション

ナノマテリアルの物性評価低次元構造の物性評価発光デバイスの製造と評価モジュール光学分光法